21–25 Sept 2026
EuXFEL
Europe/Berlin timezone

The students will gain deeper knowledge of the real and electronic structure and use of the latest generation of X-ray light sources, the Free-Electron X-ray Lasers (FEL). The FELs create X-rays with very high brilliance. The students will learn measuring methods that use ultrashort flashes of laser light in the X-ray area up to a hundred thousand times per second and with a luminosity that is several billion times higher than that of the best X-ray source of the conventional kind. Free-Electron X-ray Lasers are being used in materials research and development by catalytic, magnetic as well as biological material and hybrid structures. Various experimental methods and their specific possibilities, that can only be realised with Free-Electron X-ray Lasers, will be demonstrated and explained in detail. By means of this module students shall be enabled to incorporate the methods they have been acquainted with in this course into their later professional life when required. At the same time they gather first experiences in an international major research facility.

 

The lectures will be given mainly by Leading Scientists and Group Leaders of the European XFEL. The first day, 21 September, features tours of DESY and EuXFEL in the morning. The lectures will be held in person at EuXFEL in hybrid mode. Zoom participants are welcome, the link will be forwarded to the registered participants by email after the end of the registration period. Further details can be obtained from the Lecture Course coordinator – Prof. Dr. Serguei Molodtsov (serguei.molodtsov@xfel.eu)

Conference information

Date/Time

Starts

Ends

All times are in Europe/Berlin

Location

EuXFEL
Room: see lecture schedule

Extra information

Contents: Depiction of conventional and ultra-high time-resolved spectroscopic methods and methods to determine structural properties: - Inelastic and Resonant Inelastic X-ray Scattering (IXS and RIXS) - X-ray Emission Spectroscopy (XES) - X-ray Absorption Spectroscopy (XAS) - Photoelectron Spectroscopy (XPS and ARPES) - X-ray Microscopy - Coherent X-ray Diffraction (CDI) - Photon Correlation Spectroscopy (PCS) - X-ray Holography

Registration
Registration for this event is currently open.